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| Submit Date |
Name | Institute | Statement of capabilities/facilities | Statement of researcher experience |
|---|---|---|---|---|
| 2010-07-28 | Kai Dirscherl | Danish Fundamental Metrology | Atomic Force Microscopy:
-metrology SPM with enlarged scan range: 0.5mmx0.5mmx7µm -No limitation to image or pixel size: full nanometer resolution -Accredited laboratory for the determination of the mean particle diameter -Detection modes for material contrast between (partially buried) ENPs and the embedding matrix -Morphology analysis of particles, location of primary sub-particles in aggregates/agglomerates -Determination of the dimensional particle shape, volume and surface area after tip erosion Optical methods: -Particle sizing based on MIE scattering, for particle suspensions -Ellipsometry, measurement of particle anisotropy and refractive index Regarding characterisation of nanoparticles, DFM has been participating in two national projects for innovation, in the VAMAS TWA 34, as well as in the Euramet 1027 project. |
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| 2010-06-29 | Michael Krumrey | PTB | PTB 7.1, synchrotron radiation, BESSY II:
- ENPs in liquids, size and size distribution, small-angle X-ray scattering (SAXS), iMERA-plus project ‘Nanoparticles’ - after ENP deposition on reflecting surface, size and size distribution by grazing incidence SAXS (GISAXS), surface chemistry, elemental composition, speciation by X-ray fluorescence analysis (XRF), near edge X-ray absorption fine structure (NEXAFS) PTB 4.2, 5.2: size and shape of individual particles, scanning electron microscopy in transmission (TSEM, brightfield and darkfield). Evaluation of particle boundaries from TSEM images by comparison with Monte Carlo simulations. Algorithms for automatic image acquisition and particle size evaluation, analysis of several thousands of particles PTB 3.1 long term experience in analytical measurements various mass spectrometric techniques, conjunction with field flow fractionation for the separation and analysis of particles of different sizes. Raman spectroscopy, confocal microscopy |
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| 2010-06-21 | Thomas Linsinger | EC-JRC, Institute for Reference Materials and Measurements (IRMM) | - Ample experience and ISO Guide 34 accreditation for the production of reference materials; the first nanoparticle RM has already been released, certification studies are ongoing.
- Laboratory for the characterisation of nanoparticles by dynamic light scattering, disc centrifuge, AFM, SEM, zeta-potential. - Involvement of in a similar project: Development of methods for the detection of nanoparticles in food (NanoLyse) - State of the art processing facilities for reference materials of environmental origin and experience in similar projects. - Ample experience in storage and distribution of reference materials. - Involvement in the relevant CEN and ISO Committees for nanoparticles (CEN TC/352, ISO/TC226, ISO/TC24/SC4) - Access to the nanoparticles of the OECD thazard testing program via the sample storage at JRC-IHCP. |