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Read about the selected research topic. SRT25i Metrology for imaging photometry and UV radiometry for industrial applications

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Date
Name Institute Statement of capabilities/facilities Statement of researcher
experience
2010-07-05 Eric van der Ham VSL - Absolute tuneable flux from (180)/190 nm to 18 micron for spectral (irradiance) responsivity
- Spectral irradiance scale from 300 nm to 2600 nm SRT-based system. Outside this range based on filter radiometers down to 193 nm.
- SSL metrology with several goniometers and integrating spheres.
- Imaging photometry based on home-build cooled CCD camera system and large size broadband/SSL based calibration sources.


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