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| Submit Date |
Name | Institute | Statement of capabilities/facilities | Statement of researcher experience |
|---|---|---|---|---|
| 2010-07-05 | Eric van der Ham | VSL | - Absolute tuneable flux from (180)/190 nm to 18 micron for spectral (irradiance) responsivity
- Spectral irradiance scale from 300 nm to 2600 nm SRT-based system. Outside this range based on filter radiometers down to 193 nm. - SSL metrology with several goniometers and integrating spheres. - Imaging photometry based on home-build cooled CCD camera system and large size broadband/SSL based calibration sources. |