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Metrology for high-speed microelectronics
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Submit Date	Name	Institute	Statement of capabilities/facilities	Statement of researcher experience
2010-07-02	Faisal Ali Mubarak	VSL	www.vsl.nl
2010-06-28	Manuel Rodriguez	INTA - Instituto Nacional de Tecnica Aeroespacial	3 Vector Network Analysers: Agilent 4395A and E8361A, HP 8510C. Covering the following calibrations (in the frequency range 100 kHz to 50 GHz, depending on the parameter under test, for Type-N, PC 7 mm, PC 3.5 mm and PC 2.4 mm connectors): - Measurement of Reflection Coefficient of RF sources - Measurement of [S]-parameters (magnitude and phase) of 1-, 2- and several-port devices - Characterisation of directional devices (bridges and couplers) - Measurement of equivalent Source Match of power splitters - Characterisation of VNAs - Characterisation of fixed and sliding loads All this calibration work is supported by automated software, specifically developed at the laboratory, including uncertainty budget computation. The RF & Microwave Laboratory has taken part and acted as pilot laboratory in several national intercomparisons, whose results showed an excellent technical level. Calibration of oscilloscopes (rise time, bandwidth, vertical deflection, time base, trigger).