| SRT |
SRT Title |
Partnering Meeting |
| SRT01i |
Traceable quantitative surface chemical analysis for
industrial applications |
B |
| SRT02i |
Multi-sensor data fusion in dimensional metrology |
A |
| SRT03i |
Dynamic mechanical properties and long-term deformation
behaviour of viscous materials |
A |
| SRT04i |
Thermal design and time-dependent dimensional drift
behaviour of sensors, materials and structures |
A |
| SRT05i |
Dimensional characterisation of functional structured
surfaces |
A |
| SRT06i |
Optical and tactile metrology for absolute form
characterization |
A |
| SRT07i |
New generation of frequency standards for industry
|
C |
| SRT08i |
Radio frequency metrology for wireless networks in
industrial environments |
C |
| SRT09i |
Metrology for Ultrafast Electronics and High-Speed
Communications |
C |
| SRT10i |
Metrology for high-speed microelectronics |
C |
| SRT11i |
Metrology for advanced industrial magnetics |
C |
| SRT12i |
Electromagnetic characterization of materials for
industrial applications up to microwave frequencies |
C |
| SRT13i |
Ionizing Radiation Metrology for Metallurgical Industry
|
E |
| SRT14i |
Vacuum metrology for production environments |
A |
| SRT15i |
Metrology of Small Structures for the Manufacturing of
Electronic and Optical Devices |
A |
| SRT16i |
Metrology to Assess the Durability and Function of
Engineered Surfaces |
A |
| SRT17i |
Optical Sensing of Large Objects in Production
Engineering |
A |
| SRT18i |
Metrology for the manufacturing of thin films |
A |
| SRT19i |
Flow metrology for industrial process control |
B &
H |
| SRT20i |
Traceable Dynamic Measurement of Mechanical Quantities
|
B &
I |
| SRT21i |
High Pressure Metrology for Industrial Applications
|
B |
| SRT22i |
Weighing instruments for traffic application |
B &
J |
| SRT23i |
Force and Torque for industrial applications |
B &
K |
| SRT24i |
Optical Metrology for Appearance of Advanced Functional
Surfaces |
F |
| SRT25i |
Metrology for Imaging Photometry and UV Radiometry for
Industrial applications |
F |
| SRT26i |
Metrology for Industrial Quantum Communication
Technologies |
F |
| SRT27i |
Thermal Conductivity metrology for High-Temperature
Insulation |
B |
| SRT28i |
High Temperature Metrology for Industrial Applications
(>1000 °C) |
G |