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| Overview | Stage 1 PRTs (Closed) |
Stage 2 JRPs & REGs (Closed) |
Stage 3 REGs & RMGs (NOW CLOSED) |
OPEN CALL ESRMGs (OPEN) |
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| SRT | SRT Title | Partnering Meeting |
| SRT01i | Traceable quantitative surface chemical analysis for industrial applications | B |
| SRT02i | Multi-sensor data fusion in dimensional metrology | A |
| SRT03i | Dynamic mechanical properties and long-term deformation behaviour of viscous materials | A |
| SRT04i | Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures | A |
| SRT05i | Dimensional characterisation of functional structured surfaces | A |
| SRT06i | Optical and tactile metrology for absolute form characterization | A |
| SRT07i | New generation of frequency standards for industry | C |
| SRT08i | Radio frequency metrology for wireless networks in industrial environments | C |
| SRT09i | Metrology for Ultrafast Electronics and High-Speed Communications | C |
| SRT10i | Metrology for high-speed microelectronics | C |
| SRT11i | Metrology for advanced industrial magnetics | C |
| SRT12i | Electromagnetic characterization of materials for industrial applications up to microwave frequencies | C |
| SRT13i | Ionizing Radiation Metrology for Metallurgical Industry | E |
| SRT14i | Vacuum metrology for production environments | A |
| SRT15i | Metrology of Small Structures for the Manufacturing of Electronic and Optical Devices | A |
| SRT16i | Metrology to Assess the Durability and Function of Engineered Surfaces | A |
| SRT17i | Optical Sensing of Large Objects in Production Engineering | A |
| SRT18i | Metrology for the manufacturing of thin films | A |
| SRT19i | Flow metrology for industrial process control | B & H |
| SRT20i | Traceable Dynamic Measurement of Mechanical Quantities | B & I |
| SRT21i | High Pressure Metrology for Industrial Applications | B |
| SRT22i | Weighing instruments for traffic application | B & J |
| SRT23i | Force and Torque for industrial applications | B & K |
| SRT24i | Optical Metrology for Appearance of Advanced Functional Surfaces | F |
| SRT25i | Metrology for Imaging Photometry and UV Radiometry for Industrial applications | F |
| SRT26i | Metrology for Industrial Quantum Communication Technologies | F |
| SRT27i | Thermal Conductivity metrology for High-Temperature Insulation | B |
| SRT28i | High Temperature Metrology for Industrial Applications (>1000 °C) | G |
Return to Call web page for information on partnering meetings.
© EURAMET e.V. 2012